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Effect of atomic hydrogen on boron-doped germanium: An ab initio study

机译:原子氢对掺硼锗的影响:从头算研究

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Interaction between interstitial hydrogen (H) and boron (B) in germanium (Ge) is studied by at initio calculations to explore the effect of hydrogen on p-type Ge. The geometry, electronic structure, and frequency of local vibrational mode (LVM) of H in the stable B-H complex are determined. The interstitial hydrogen is found to reside between the B and Ge atoms and deactivate B dopant. The dissociation energy of the defect complex is calculated to be 1.06 eV, higher than trfat in Si. The frequency of LVM of isolated H at the Ge-Ge bond center and at the most stable bond minimum sites is also given and compared to experimental observations.
机译:通过计算从头计算研究锗(Ge)中间隙氢(H)和硼(B)之间的相互作用,以探索氢对p型Ge的影响。确定了稳定的B-H络合物中H的几何形状,电子结构和局部振动模式(LVM)的频率。发现间隙氢存在于B和Ge原子之间并使B掺杂剂失活。缺陷复合物的离解能经计算为1.06 eV,高于Si中的trfat。还给出了在Ge-Ge键中心和最稳定的键最小位点处的孤立H的LVM频率,并将其与实验观察结果进行比较。

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