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Practicality of compensating the loss in the plasmonic waveguides using semiconductor gain medium

机译:使用半导体增益介质补偿等离子体波导中损耗的实用性

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摘要

We consider the issue of compensating the loss in plasmonic waveguides with semiconductor gain material and show that, independent of specific geometry, full loss compensation in plasmonic waveguides with significantly sub-wavelength light confinement (less than λ/4n) requires current density well in excess of 100kA/cm~2. This high current density is attributed to the unavoidable shortening of recombination time caused by the Purcell effect inherent to sub-wavelength confinement. Consequently, an injection-pumped plasmonic laser that is truly sub-wavelength in all three dimensions ("spaser") would have threshold current densities that are hard to obtain in any conceivable semiconductor device.
机译:我们考虑了用半导体增益材料补偿等离子体波导中的损耗的问题,并表明,与特定的几何形状无关,具有显着亚波长光限制(小于λ/ 4n)的等离子体波导中的全损耗补偿要求电流密度足够大100kA / cm〜2。该高电流密度归因于亚波长限制固有的赛尔效应(Purcell effect)不可避免地缩短了重组时间。因此,在所有三个维度上真正亚波长的注入泵浦等离子体激元激光器(“ spaser”)将具有在任何可能的半导体器件中都难以获得的阈值电流密度。

著录项

  • 来源
    《Applied Physics Letters》 |2012年第1期|p.011105.1-011105.3|共3页
  • 作者

    Jacob B. Khurgin; Greg Sun;

  • 作者单位

    Johns Hopkins University, Baltimore, Maryland 21218, USA;

    University of Massachusetts, Boston, Massachusetts 02125, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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