机译:利用基于共振的质量传感器测量超薄膜的杨氏模量和体积质量密度/厚度
Advanced Institute of Manufacturing with High-tech Innovations (AIM-HI), National Chung Cheng University, Chia-yi County, Taiwan,Department of Mechanical Engineering, National Chung Cheng University, Chia-yi County, Taiwan,Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic;
Institute of Physics, Czech Academy of Sciences, Prague, Czech Republic;
Advanced Institute of Manufacturing with High-tech Innovations (AIM-HI), National Chung Cheng University, Chia-yi County, Taiwan,Department of Mechanical Engineering, National Chung Cheng University, Chia-yi County, Taiwan;
机译:利用基于共振的质量传感器测量超薄膜的杨氏模量和体积质量密度/厚度
机译:结合蒙特卡罗-有限元模拟和实验同时评估超薄膜质量密度和杨氏模量的新方法
机译:在施加轴向力的情况下,利用微/纳谐振器同时测定超薄膜的弹性模量和密度/厚度
机译:光学激发纳米膜谐振器的谐振频率测量,测定原子层沉积薄膜的密度和杨氏模量
机译:定向超薄薄膜的运输(荧光淬火,淬火,大众运输,L B薄膜)。
机译:免疫测定法与质谱法测定男性性类固醇的比较以及与皮质和小梁体积骨矿物质密度的关系
机译:利用振动双夹持微/纳米束同时测定超薄膜的残余应力,弹性模量,密度和厚度
机译:双saW传感器技术用于确定气体吸附过程中薄硅酸盐薄膜的质量和模量变化