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Superconducting nanowire detector jitter limited by detector geometry

机译:受探测器几何形状限制的超导纳米线探测器抖动

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摘要

Detection jitter quantifies variance introduced by the detector in the determination of photon arrival time. It is a crucial performance parameter for systems using superconducting nanowire single photon detectors (SNSPDs). In this work, we have demonstrated that the detection timing jitter is limited in part by the spatial variation of the photon detection events along the length of the wire. We define this jitter source as a geometric jitter since it is related to the length and area of the SNSPD. To characterize the geometric jitter, we have constructed a differential cryogenic readout with less than 7 ps of an electronic jitter that can amplify the pulses generated from the two ends of an SNSPD. By differencing the measured arrival times of the two electrical pulses, we were able to partially cancel out the difference of the propagation times and thus reduce the uncertainty of the photon arrival time. We proved that the variation of the differential propagation time was a few ps for a 3 μm × 3 μm device, while it increased up to 50 ps for a 20 μm × 20 μm device. In a 20 μm × 20 μm large SNSPD, we achieved a 20% reduction in the overall detection timing jitter for detecting the telecom-wavelength photons by using the differential cryogenic readout.
机译:检测抖动量化了检测器在确定光子到达时间时引入的方差。对于使用超导纳米线单光子探测器(SNSPD)的系统来说,它是至关重要的性能参数。在这项工作中,我们已经证明了检测定时抖动部分受到沿导线长度的光子检测事件的空间变化的限制。我们将此抖动源定义为几何抖动,因为它与SNSPD的长度和面积有关。为了表征几何抖动,我们构建了一个差分低温读数,其电子抖动小于7 ps,可以放大从SNSPD两端产生的脉冲。通过对两个电脉冲的到达时间进行测量,我们可以部分抵消传播时间的差异,从而减少了光子到达时间的不确定性。我们证明,对于3μm×3μm的器件,差分传播时间的变化为几ps,而对于20μm×20μm的器件,其上升到50 ps。在20μm×20μm的大型SNSPD中,通过使用差分低温读出,我们在检测电信波长光子的总检测定时抖动中实现了20%的降低。

著录项

  • 来源
    《Applied Physics Letters》 |2016年第15期|152601.1-152601.4|共4页
  • 作者单位

    Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA ,Dipartimento di Elettronica, Informazione e Bioingegneria, Piazza Leonardo da Vinci 32, 20133 Milano, Italy;

    Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA;

    Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA;

    Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA;

    Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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