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Fabrication of three dimensional diamond ultraviolet photodetector through down-top method

机译:倒置法制作三维金刚石紫外光电探测器

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摘要

Three dimensional diamond ultraviolet (UV) photodetector have been fabricated on diamond epitaxial layer through down-top approach, where diamond epitaxial layer was grown between metal electrodes. A thin diamond epitaxial layer was first grown on high-pressure high-temperature single crystal diamond substrate. Then, the diamond epitaxial layer was covered by interdigitated tungsten electrodes. Furthermore, another diamond epitaxial layer was grown on uncovered area. At last, UV-Ozone treatment was used to oxidize the surface. The optoelectronic performance of the photodetector was characterized, exhibiting a large responsivity and a repeatable transient response behavior. Moreover, down-top process is beneficial for the electrode conductivity stability. Also, an ohmic contact could be formed between tungsten and diamond during growth. The results indicate that down-top process is an efficient way for fabrication of three dimensional diamond photodetectors.
机译:通过自上而下的方法在金刚石外延层上制造了三维金刚石紫外(UV)光电探测器,其中金刚石外延层生长在金属电极之间。首先在高压高温单晶金刚石衬底上生长金刚石外延薄层。然后,金刚石外延层被叉指的钨电极覆盖。此外,另一金刚石外延层生长在未覆盖区域上。最后,使用紫外线臭氧处理来氧化表面。表征了光电检测器的光电性能,表现出大的响应度和可重复的瞬态响应行为。而且,自顶向下工艺有利于电极电导率稳定性。同样,在生长过程中,钨和金刚石之间可能会形成欧姆接触。结果表明,自顶向下工艺是制造三维金刚石光电探测器的有效方法。

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  • 来源
    《Applied Physics Letters》 |2016年第15期|153507.1-153507.4|共4页
  • 作者单位

    Institute of Wide Bandgap Semiconductors, Xi'an Jiaotong University, Xi'an 710049, China ,Shaanxi Key Laboratory of Photonics Technology for Information, Xi'an Jiaotong University, Xi'an 710049, China ,Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan;

    Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan;

    Institute of Wide Bandgap Semiconductors, Xi'an Jiaotong University, Xi'an 710049, China;

    Institute of Wide Bandgap Semiconductors, Xi'an Jiaotong University, Xi'an 710049, China ,Shaanxi Key Laboratory of Photonics Technology for Information, Xi'an Jiaotong University, Xi'an 710049, China;

    Nation Key Laboratory of ASIC, HSRI, Shijiazhuang 050051, China;

    Shaanxi Key Laboratory of Photonics Technology for Information, Xi'an Jiaotong University, Xi'an 710049, China;

    Institute of Wide Bandgap Semiconductors, Xi'an Jiaotong University, Xi'an 710049, China ,Shaanxi Key Laboratory of Photonics Technology for Information, Xi'an Jiaotong University, Xi'an 710049, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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