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首页> 外文期刊>Advanced Functional Materials >High-Mobility Air-Stable Solution-Shear-Processed n-Channel Organic Transistors Based on Core-Chlorinated Naphthalene Diimides
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High-Mobility Air-Stable Solution-Shear-Processed n-Channel Organic Transistors Based on Core-Chlorinated Naphthalene Diimides

机译:基于核心氯化萘二酰亚胺的高迁移率空气稳定溶液剪切处理的n沟道有机晶体管

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摘要

High charge carrier mobility solution-processed n-channel organic thin-film transistors (OTFTs) based on core-chlorinated naphthalene tetracarboxylic diimides (NDIs) with fluoroalkyl chains are demonstrated. These OTFTs were prepared through a solution shearing method. Core-chlorination of NDIs not only increases the electron mobilities of OTFTs, but also enhances their air stability, since the chlorination in the NDI core lowers the lowest unoccupied molecular orbital (LUMO) levels. The air-stability of dichlorinated NDI was better than that of the tetrachlorinated NDIs, presumably due to the fact that dichlorinated NDIs have a denser packing of the fluoroalkyl chains and less grain boundaries on the surface, reducing the invasion pathway of ambient oxygen and moisture. The devices of dichlorinated NDIs exhibit good OTFT performance, even after storage in air for one and a half months. Charge transport anisotropy is observed from the dichlorinated NDI. A dichlorinated NDI with CH_2C_3F_7 side chains reveals high mobilities of up to 0.22 and 0.57 cm~2 V~(-1) s~(-1) in parallel and perpendicular direction, respectively, with regard to the shearing direction. This mobility anisotropy is related to the grain morphology. In addition, we find that the solution-shearing deposition affects the molecular orientation in the crystalline thin films and lowers the d(001)-spacing (the out-of-plane interlayer spacing), compared to the vapor-deposited thin films. Core-chlorinated NDI derivatives are found to be highly suitable for n-channel active materials in low-cost solution-processed organic electronics.
机译:对具有氟代烷基链的核心氯化萘四羧酸二酰亚胺(NDI)的高电荷载流子迁移率溶液处理的n沟道有机薄膜晶体管(OTFT)进行了演示。这些OTFT通过溶液剪切法制备。 NDI的核心氯化不仅增加OTFT的电子迁移率,而且还增强了它们的空气稳定性,因为NDI核心中的氯化降低了最低的未占用分子轨道(LUMO)含量。二氯化NDI的空气稳定性优于四氯化NDI,这可能是由于二氯化NDI具有更稠密的氟代烷基链堆积和表面上较少的晶界这一事实,从而减少了外界氧气和水分的入侵途径。即使在空气中存储一个半月后,二氯化NDI装置仍具有良好的OTFT性能。从二氯化NDI中观察到电荷传输各向异性。带有CH_2C_3F_7侧链的二氯化NDI在剪切方向上平行和垂直方向上的迁移率分别高达0.22和0.57 cm〜2 V〜(-1)s〜(-1)。该迁移率各向异性与晶粒形态有关。此外,我们发现,与气相沉积薄膜相比,溶液剪切沉积会影响晶体薄膜中的分子取向,并降低d(001)间距(平面外层间间距)。发现核心氯化NDI衍生物非常适合低成本溶液加工的有机电子产品中的n通道活性材料。

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  • 来源
    《Advanced Functional Materials》 |2011年第21期|p.4173-4181|共9页
  • 作者单位

    Department of Chemical Engineering Stanford University 381 North-South Mall, Stanford, CA 94305, USA,Department of Chemical Engineering National Taiwan University Institute of Polymer Science and Engineering National Taiwan University Taipei 106, Taiwan;

    Department of Chemical Engineering Stanford University 381 North-South Mall, Stanford, CA 94305, USA,School of Nano-Bioscience and Chemical Engineering and KIER-UNIST Advanced Center for Energy Ulsan National Institute of Science and Technology Ulsan 689-798, Korea;

    Institut fur Organische Chemie and Rontgen Research Center for Complex Material Systems Universitat Wurzburg Am Hubland, 97074 Wurzburg, Germany;

    Department of Chemical Engineering National Taiwan University Institute of Polymer Science and Engineering National Taiwan University Taipei 106, Taiwan;

    Institut fur Organische Chemie and Rontgen Research Center for Complex Material Systems Universitat Wurzburg Am Hubland, 97074 Wurzburg, Germany;

    Department of Chemical Engineering Stanford University 381 North-South Mall, Stanford, CA 94305, USA;

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