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Indium tin oxide exhibiting high poly-crystallinity on oxygen plasma-treated polyethylene terephthalate surface

机译:在氧等离子体处理的聚对苯二甲酸乙二酯表面上呈现高多结晶度的氧化铟锡

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摘要

Low-resistivity indium tin oxide [ITO] film was successfully deposited on oxygen plasma-treated polyethylene terephthalate [PET] surfaces at room temperature. X-ray diffraction [XRD] measurements demonstrated that the film deposited on the PET surface that had not been treated with oxygen plasma had an amorphous structure. In contrast, after the low-power oxygen plasma treatment of the PET surface, the ITO film deposited on the PET surface had a poly-crystalline structure due to interactions between electric dipoles on the PET surface and electric dipoles in the ITO film. The minimum resistivity of the poly-crystalline ITO was about 3.6 times lower than that of the amorphous ITO film. In addition, we found that the resistivity of ITO film is proportional to the intensity of the (400) line in the film's XRD spectra.
机译:低电阻率的铟锡氧化物[ITO]膜在室温下成功地沉积在氧等离子体处理的聚对苯二甲酸乙二醇酯[PET]表面上。 X射线衍射[XRD]测量表明,未用氧等离子体处理的沉积在PET表面上的膜具有非晶结构。相反,在PET表面的低功率氧等离子体处理之后,由于PET表面上的电偶极与ITO膜中的电偶极之间的相互作用,沉积在PET表面上的ITO膜具有多晶结构。多晶ITO的最小电阻率比非晶ITO膜的最小电阻率低约3.6倍。此外,我们发现ITO薄膜的电阻率与薄膜XRD光谱中(400)线的强度成正比。

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