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Spectroelectrochemical Signatures of Surface TrapPassivation on CdTe Nanocrystals

机译:表面阱的光谱电化学特征CdTe纳米晶体上的钝化

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摘要

The photoluminescence (PL) quantum yield of semiconductor nanocrystals (NCs) is hampered by in-gap trap states due to dangling orbitals on the surface of the nanocrystals. While crucial for the rational design of nanocrystals, the understanding of the exact origin of trap states remains limited. Here, we treat CdTe nanocrystal films with different metal chloride salts and we study the effect on their optical properties with in situ spectroelectrochemistry, recording both changes in absorption and photoluminescence. For untreated CdTe NC films we observe a strong increase in the PL intensity as the Fermi-level is raised electrochemically and trap states in the bandgap become occupied with electrons. Upon passivation of these in-gap states we observe an increase in the steady state PL and, for the best treatments, we observe that the PL no longer depends on the position of the Fermi level in the band gap, demonstrating the effective removal of trap states. The most effective treatment is obtained for Z-type passivation with CdCl2, for which the steady state PL increased bya factor 40 and the PL intensity became nearly unaffected by the appliedpotential. X-ray Photoelectron Spectroscopy measurements show thattreatment with ZnCl2 mainly leads to X-type passivationwith chloride ions, which increased the PL intensity by a factor fourand made the PL less susceptible to modulation by applying a potentialwith respect to unpassivated nanocrystal films. We elucidate the spectroelectrochemicalsignatures of trap states within the bandgap and conclude that undercoordinatedTe at the surface constitutes the largest contribution to in-gap trapstates, but that other surface states that likely originate on Cdatoms should also be considered.
机译:半导体纳米晶体(NC)的光致发光(PL)量子产率因纳米晶体表面上的悬挂轨道而受到间隙内陷阱态的阻碍。尽管对于合理设计纳米晶体至关重要,但对陷阱态确切起源的理解仍然有限。在这里,我们用不同的金属氯化物盐处理CdTe纳米晶体膜,并用原位光谱电化学研究其对光学性质的影响,记录吸收和光致发光的变化。对于未经处理的CdTe NC薄膜,随着费米能级的电化学升高,带隙中的陷阱态被电子占据,PL强度会大大增加。钝化这些能隙状态后,我们观察到稳态PL增大,对于最佳处理,我们观察到PL不再取决于费米能级在带隙中的位置,这表明陷阱的有效去除状态。对于CdCl2的Z型钝化,可获得最有效的处理,其稳态PL增加了系数为40,PL强度几乎不受施加的影响潜在。 X射线光电子能谱测量表明ZnCl2处理主要导致X型钝化含氯离子,使PL强度增加了四倍通过施加电势使PL不太容易受到调制的影响关于未钝化的纳米晶体膜。我们阐明了光谱电化学带隙内陷阱状态的信号并得出结论,表面处的Te对带隙陷阱的贡献最大态,但其他可能源自镉的表面态原子也应该被考虑。

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