氧化石墨烯的离子束辐照表面改性

摘要

Low energy N+ ion beam was used to irradiate graphene oxide (GO),so as to explore the irradiation effects on graphene oxide surface.The irradiated graphene oxide was characterized by Raman spectroscopy (Raman),atomic force microscopy (AFM) and transmission electron microscopy (TEM).The results showed that atoms migrated and rearranged on the surface of graphene oxide due to thermal effects and collisions in the irradiated area.On certain irradiation dose,N+ irradiation on graphene oxide had lead to the formation of nanopores and local crystallization on the surface of graphene oxide.Raman results showed that the intensity ratio of characteristic peaks,ID/IG reduced significantly after irradiation.These results indicated that the ion beam irradiation reduced the surface defects of the graphene oxide,achieved the expected modification effect.%采用低能N-离子束对氧化石墨烯进行辐照,研究离子束辐照对石墨烯表面的改性作用,通过拉曼光谱仪(Raman)、原子力显微镜(AFM)和透射电子显微镜(TEM)表征了氧化石墨烯的辐照效果.结果表明,由于辐照产生的原子碰撞和热效应,在一定的N+辐照剂量下,氧化石墨烯表面发生原子的迁移、重排,在表面产生了纳米孔和晶化现象.Raman结果显示,相对于未辐照组,辐照后的氧化石墨烯特征峰相对强度比值ID/IG明显降低,表明离子束辐照减少了氧化石墨烯表面缺陷,具有明显的改性效果.