扫描近场光学显微镜对纳米结构的观察

摘要

A polydiacetylene nanocrystalline film has been fabricated using surface evaporationmethod and observed by using Aurora 2000, TopoMetrix scanning near-field optical microscope(SNOM) system. The SNOM images of this film together with the standard testing Al sampleindicate that the resolution of the system is better than 80 nm 1/6 of the incident wavelength,488 nm. The possibility of SNOM data storage using thus fabricated film is also demonstrated.