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Carrier escape from semiconductor quantum wells.

机译:载流子从半导体量子阱中逸出。

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摘要

The escape of photogenerated carriers from semiconductor quantum wells is investigated theoretically and experimentally. Calculations of the tunnelling, thermionic emission, and thermally-assisted tunnelling escape times are given, where the thermionic emission process is splint into low and high field regimes. At low fields, the escape rate is limited by the diffusion of the continuum carriers away from the well, while at high fields, the scattering rate from the confined to continuum states is the limiting process.;Barrier lowering effects are reviewed. The image force barrier lowering in a quantum well is calculated in the classical quasi-static approximation where the diffusion current is included for the first time. Both bipolar and unipolar wells are considered. In each case, the diffusion current inhibits the image charge formation, resulting in significant reductions in the barrier lowering; this is quantified by the concept of the effective image charge. At high carrier densities in the well (;Calculations of the 2D-to-3D scattering rate required for the high field description of thermionic emission are presented where the effects of a transverse electric field are explicitly included. Deformation potential and piezoelectric scattering by acoustic phonons are considered for the first time, as well as polar scattering by acoustic phonons are considered for the first time, as well as polar scattering by longitudinal optical (LO) phonons. It is found that polar LO phonon absorption dominates the thermionic emission rate at all temperatures despite its infinitesimal occupation factor at low temperatures. As the electric field is increased, the scattering function is smeared such that the rate is reduced just above the barrier, while a low energy tail extends to energies below the barrier. The scattering function does not shift with the potential barrier as expected, nor does the scattering rate rise abruptly at the barrier energy. It is found that the emission rate oscillates as a function of the well width, with the jumps in emission rate corresponding to the confinement of a new upper subband.;Fits to the calculated scattering functions are presented as the basis for a simplified thermionic emission calculation. The step function approximation gives a simple analytic formula but performs well only in limited cases. A more complex approach, where the scattering function is approximated as a Fermi-Dirac function, reproduces the results of the full calculation to within 10% in most situations.;Calculated electron escape times are compared with reported experimental values from an asymmetric GaAs/AlGaAl quantum well with qualitative success. While the bias dependence was well reproduced, the calculated thermionic emission times were slow by factors of ;Measurements of hole escape times in an InGaAsP/InP multiple quantum well laser structure using time-resolved photoconductivity (PC) are presented as a function of temperature and bias. These are compared with calculated values which reproduce the qualitative behaviour but underestimate the thermionic emission time by one to two orders of magnitude. This is attributed primarily to the complexity of the valence band structure, further illustrating its impact on thermionic emission calculations. (Abstract shortened by UMI.).
机译:从理论上和实验上研究了光生载流子从半导体量子阱中的逸出。给出了隧穿,热电子发射和热辅助隧穿逃逸时间的计算,其中热电子发射过程被分为低场和高场两种状态。在低场下,逃逸率受到连续载流子远离井的扩散的限制,而在高场下,从受限态到连续态的散射率是限制过程。量子阱中图像力势垒的降低是通过经典的准静态近似法计算的,其中首次包含了扩散电流。双极和单极井都被考虑了。在每种情况下,扩散电流都会抑制图像电荷的形成,从而大大降低势垒的降低。这可以通过有效图像电荷的概念来量化。在井中具有高载流子密度的情况下(;给出了热电子发射的高场描述所需的2D到3D散射率的计算,其中明确包括了横向电场的影响。声子的形变势和压电散射首次考虑了声子的极性散射,也考虑了纵向光学(LO)声子的极性散射,发现极性LO声子的吸收在所有热电子发射速率中占主导地位。尽管在低温下具有无限的占有率,但随着温度的升高,散射功能被涂抹,使得速率仅在势垒上方降低,而低能尾部则延伸至势垒下方的能量。随势垒移动,正如预期的那样,在势垒能量下散射速率也不会突然增加。发射速率随阱宽度的变化而振荡,发射速率的跃迁对应于新的上子带的限制。给出了对计算散射函数的拟合,作为简化热电子发射计算的基础。阶跃函数逼近给出了一个简单的解析公式,但仅在有限的情况下才能很好地执行。更复杂的方法是将散射函数近似为费米-狄拉克(Fermi-Dirac)函数,在大多数情况下将完整计算的结果重现到10%以内。;将计算出的电子逸出时间与非对称GaAs / AlGaAl的报告实验值进行比较量子定性成功。虽然可以很好地再现偏压的依赖性,但由于以下因素,计算出的热电子发射时间变慢;使用时间分辨的光电导率(PC)测量了InGaAsP / InP多量子阱激光结构中空穴逸出时间的测量结果是温度和温度的函数。偏压。将这些与计算值进行比较,该计算值可再现定性行为,但将热电子发射时间低估了一到两个数量级。这主要归因于价带结构的复杂性,进一步说明了其对热电子发射计算的影响。 (摘要由UMI缩短。)。

著录项

  • 作者

    Takasaki, Bruce Warren.;

  • 作者单位

    McMaster University (Canada).;

  • 授予单位 McMaster University (Canada).;
  • 学科 Condensed matter physics.
  • 学位 Ph.D.
  • 年度 1996
  • 页码 219 p.
  • 总页数 219
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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