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High operating temperature of passively mode-locked InGaAsP/InP semiconductor lasers

机译:被动锁模InGaAsP / InP半导体激光器的高工作温度

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摘要

This thesis is concerned with the design and fabrication of MLLDs and assessment of the possibility of their uncooled operation. Fundamental mode locked laser diodes (MLLDs) were fabricated on both semi- insulating InP substrates and n-doped InP substrates. Devices were fabricated on semi-insulating InP substrates to allow for efficient direct modulation of the saturable absorber so that the output pulses can be synchronised to an external clock for communication applications. The devices fabricated from the semi-insulating substrate however only lase at operating temperatures of ≤20 °C and can only be mode locked at temperatures of ≤ 10 °C. Devices fabricated from epilayer grown on n-doped substrate could lase at temperatures of > 80 °C. For cavity lengths of 1.2 mm with absorber lengths of 40 mum these devices can be mode locked at temperatures of up to 65°C. The microwave spectra showed peaks at around 36 GHz with more than 35 dB above the noise floor. The full width half maximum (FWHM) of the spectra were 300 kHz across all the temperatures tested (15 °C to 65 °C), limited by the resolution bandwidth of 300 kHz. A positive shift of about 55 MHz was observed in the mode locked frequency between the operating temperatures of 15 to 65 °C. Passive mode locking was achieved at 75 using devices with absorber lengths of 20 mum. These devices however did not mode lock at lower temperatures. Devices with adaptable absorbers could be mode locked at temperatures from 15°C to 75°C These devices had three contact pads such that at temperatures of ≤ 65 °C, two of the shorter contact pads were biased as absorbers, while at temperatures of > 65 °C, only one of the shorter contact pads was biased as absorber. Microwave spectra showed peaks at around 37 GHz with more than 35 dB above noise floor across all the temperatures tested (15 °C to 75 °C). The tuning range, achieved via varying of absorber bias voltages, was discovered to vary with operating temperature, increasing from a tuning range of about 12 MHz at 15 °C to a tuning range of about 25 MHz at 55°C. Pilsewidth measurement was carried out using second harmonic generation autocorrelation. Due to power limitations, pulsewidths could only be measured up to at operating temperature of 35 °C. The pulsewidths varied between about 4 ps to alout 5.5 ps for absorber bias voltages of -0.3 V to +0.2 V. No relationship could be observed between the operating temperatures and the optical pulsewidths.
机译:本论文涉及MLLD的设计和制造以及其非制冷运行的可能性的评估。在半绝缘的InP衬底和n掺杂的InP衬底上都制造了基本锁模激光二极管(MLLD)。器件在半绝缘的InP衬底上制造,以实现可饱和吸收体的有效直接调制,从而可以将输出脉冲同步到用于通信应用的外部时钟。但是,由半绝缘基板制成的设备只能在≤20°C的工作温度下发射激光,并且只能在≤10°C的温度下锁模。由生长在n掺杂衬底上的外延层制成的器件可能会在> 80°C的温度下发射激光。对于腔长为1.2毫米,吸收器长度为40毫米的器件,这些设备可在高达65°C的温度下锁模。微波频谱显示出在36 GHz附近的峰值,高于本底噪声超过35 dB。在所有测试温度(15°C至65°C)下,光谱的半峰全宽(FWHM)为300 kHz,受限于300 kHz的分辨率带宽。在15至65°C的工作温度之间的锁模频率中观察到约55 MHz的正移。使用吸收器长度为20毫米的设备在75处实现了被动模式锁定。但是,这些设备在较低温度下并未锁模。具有自适应吸收器的设备可以在15°C至75°C的温度下锁模。这些设备具有三个接触垫,因此在≤65°C的温度下,两个较短的接触垫被偏置为吸收器,而在> 65°C,只有较短的一个接触垫被偏置为吸收体。微波光谱显示,在所有测试温度(15°C至75°C)下,峰值均在本底噪声附近约37 GHz处超过35 dB。发现通过改变吸收器偏置电压实现的调谐范围随工作温度而变化,从15°C时约12 MHz的调谐范围增加到55°C时约25 MHz的调谐范围。使用二次谐波产生自相关进行柱宽测量。由于功率限制,只能在高达35°C的工作温度下测量脉冲宽度。对于-0.3 V至+0.2 V的吸收器偏置电压,脉冲宽度在大约4 ps至大约5.5 ps之间变化。在工作温度和光学脉冲宽度之间未发现任何关系。

著录项

  • 作者

    Tan, Wei Kiong.;

  • 作者单位

    University of Glasgow (United Kingdom).;

  • 授予单位 University of Glasgow (United Kingdom).;
  • 学科 Electrical engineering.
  • 学位 Ph.D.
  • 年度 2005
  • 页码 154 p.
  • 总页数 154
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 海洋工程;
  • 关键词

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