首页> 外文学位 >Utilization of Semiconductors Piezoresistive Properties in Mechanical Strain Measurements under Varying Temperature Conditions for Structural Health Monitoring Applications.
【24h】

Utilization of Semiconductors Piezoresistive Properties in Mechanical Strain Measurements under Varying Temperature Conditions for Structural Health Monitoring Applications.

机译:在结构温度监测应用中,在变化的温度条件下机械应变测量中半导体压阻特性的利用。

获取原文
获取原文并翻译 | 示例

摘要

Strain gauges have been powerful tools in experimental stress analysis. This importance is expected to continue, even though other means of strain measurement are continually introduced to the market. The strain gauge is a simple device that can be easily installed to measure mechanical strain. By far, the one-dimensional single-filament has been the most common strain gauge. Conventional strain gauges are typically made from thin-foil metal; thus the resistivity change under stress is insignificant. On the other hand, semiconductor material demonstrated considerable resistivity change as a result of the applied mechanical strain or stress.;Piezoresistivity theory is presented and applied to develop a new MEMS strain sensor. Taking into account all geometric and material characteristics, various tools and techniques, such as indicial equations, Finite Element Modeling (FEM) (ANSYS10.0RTM), and experimental evaluation, were employed to go through the development cycle of the piezoresistive strain sensor. In addition, alignment errors during microfabrication have been investigated. The proper microfabrication parameters and piezoresistors configuration were selected by investigating the silicon crystal material properties based on the crystallographic directions. A microfabrication process flow has been developed exploring a group of fabrication processes available at the University of Alberta micromachining and nanofabrication facility (NanoFab).;In order to minimize the loss in the transferred strain, geometric features were created in the silicon substrate. These geometric features have resulted in stress discontinuity in their vicinity, which introduced the concept of geometrical gauge factor. The geometrical gauge factor is a new concept that can 'virtually' improve the performance of any piezoresistive sensor by utilizing the silicon carrier to increase the differential stress around the piezoresistive sensing elements. The main limitation to use this concept is whether or not material properties will accommodate the resulted stress concentration without failing the sensor.;The developed sensor was evaluated, tested, and characterized at the University of Alberta and Syncrude Canada Edmonton Development Research Center. Uniaxial tension was utilized to calibrate a number of chip designs. The temperature coefficient of resistance (TCR) was also evaluated. Preliminary packaging procedure was proposed and applied. Comparing the performance characteristics of the developed MEMS strain sensor to a 350 thin-foil strain gauge showed that the piezoresistive MEMS strain sensor had better performance characteristics: sensitivity and resolution, with room for significant improvements. In addition, the MEMS strain sensor can be successfully applied under varying temperature conditions.;In this work, the piezoresistive characteristics of silicon crystal are investigated to realize a robust Micro Electro Mechanical (MEMS) strain sensor. This sensor has been developed to withstand harsh environmental conditions, such as those in Structural Health Monitoring (SHM) applications. Silicon strain gauges have demonstrated higher gauge factor, sensitivity, and accuracy compared to conventional thin-foil strain gauges. Unfortunately, silicon strain gauges suffer from large temperature effect, which influences their performance dramatically. This temperature effect puts various challenges on the development and application of semiconductor sensors. On top of these challenges are the temperature compensation of the output signal, packaging, and fabrication. In addition, transferring strain through different structural layers causes substantial loss in the sensed strain values.;The solution of the above challenges and the small size of MEMS sensors have resulted in a novel MEMS-based strain sensor with low power consumption, compared to conventional strain gauges. This low power consumption promotes this sensor in wireless SHM systems as the sensing unit, which can extend such technology to wider range of applications. The MEMS strain sensor has potential to provide a valuable tool to improve the current SHM systems as well as allowing higher number of sensors to be economically deployed. As a result, the reliability of both the SHM system and equipment will be enhanced, which will reflect positively on the economic performance of the equipment.
机译:应变仪已成为实验应力分析的有力工具。即使将应变测量的其他手段不断引入市场,也有望继续保持这种重要性。应变仪是一种简单的设备,可以很容易地安装以测量机械应变。到目前为止,一维单丝已成为最常见的应变仪。传统的应变仪通常由薄箔金属制成。因此,应力下的电阻率变化不明显。另一方面,由于施加的机械应变或应力,半导体材料表现出相当大的电阻率变化。提出了电阻率理论,并将其用于开发新的MEMS应变传感器。考虑到所有几何和材料特性,采用了各种工具和技术,例如独立方程式,有限元建模(FEM)(ANSYS10.0RTM)和实验评估,以经历压阻应变传感器的开发周期。另外,已经研究了微加工期间的对准误差。通过根据晶体学方向研究硅晶体材料的性能,选择合适的微加工参数和压阻器配置。已经开发了微加工工艺流程,探索了阿尔伯塔大学微加工和纳米加工设施(NanoFab)可用的一组加工工艺;为了最小化转移应变的损失,在硅基板上创建了几何特征。这些几何特征导致它们附近的应力不连续,从而引入了几何规格因数的概念。几何规格因数是一个新概念,可以通过利用硅载体增加压阻传感元件周围的压差来“虚拟地”改善任何压阻传感器的性能。使用此概念的主要限制是材料特性是否能够在不使传感器失效的情况下适应所产生的应力集中。所开发的传感器在加拿大艾伯塔大学和加拿大Syncrude Edmonton发展研究中心进行了评估,测试和表征。利用单轴张力来校准许多芯片设计。还评估了电阻温度系数(TCR)。初步包装程序被提出并应用。将已开发的MEMS应变传感器的性能特征与350薄箔形应变仪进行比较,结果表明,压阻MEMS应变传感器具有更好的性能特征:灵敏度和分辨率,还有显着提高的空间。此外,MEMS应变传感器可以在变化的温度条件下成功应用。在这项工作中,研究了硅晶体的压阻特性,以实现一种坚固的微机电(MEMS)应变传感器。该传感器的开发旨在承受恶劣的环境条件,例如结构健康监测(SHM)应用中的环境条件。与传统的薄箔形应变仪相比,硅应变仪具有更高的应变系数,灵敏度和准确性。不幸的是,硅应变计受较大的温度影响,从而极大地影响其性能。这种温度效应对半导体传感器的开发和应用提出了各种挑战。这些挑战之上是输出信号的温度补偿,封装和制造。此外,通过不同结构层传递应变会导致感测到的应变值大量损失。;与传统技术相比,上述挑战的解决方案和MEMS传感器的小尺寸导致了一种新型的基于MEMS的应变传感器,具有低功耗应变片。这种低功耗使该传感器成为无线SHM系统中的传感单元,可以将这种技术扩展到更广泛的应用范围。 MEMS应变传感器有潜力提供有价值的工具来改进当前的SHM系统,并允许经济地部署更多数量的传感器。结果,SHM系统和设备的可靠性都将得到增强,这将积极反映设备的经济性能。

著录项

  • 作者单位

    University of Alberta (Canada).;

  • 授予单位 University of Alberta (Canada).;
  • 学科 Engineering Mechanical.
  • 学位 Ph.D.
  • 年度 2013
  • 页码 250 p.
  • 总页数 250
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 老年病学;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号