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Evaluation of angle dependence in spectral emissivity of ceramic tiles measured by FT-IR

机译:傅立叶变换红外光谱法测量瓷砖光谱发射率的角度依赖性

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摘要

Ceramic tiles are widely used for building walls. False detections are caused in inspections by infrared thermography because of the infrared reflection and angle dependence of emissivity. As the first problem, ceramic tile walls are influenced from backgrounds reflection. As the second problem, in inspection for tall buildings, the camera angles are changed against the height. Thus, to reveal the relation between the emissivity and angles is needed. However, there is very little data about it. It is impossible to decrease the false detection on ceramic tile walls without resolving these problems; background reflection and angle dependence of emissivity. In this study, the angle problem was investigated. The purpose is to establish a revision method in the angle dependence of the emissivity for infrared thermography. To reveal the relation between the emissivity and angles, the spectral emissivity of a ceramic tile at various angles was measured by FT-IR and infrared thermographic instrument. These two experimental results were compared with the emissivity-angle curves from the theoretical formula. In short wavelength range, the two experimental results showed similar behavior, but they did not agree with the theoretical curve. This will be the subject of further study. In long wavelength range, the both experimental results almost obeyed the theoretical curve. This means that it is possible to revise the angle dependence of spectral emissivity, for long wavelength range.
机译:瓷砖被广泛用于建筑墙壁。由于红外反射和发射率的角度依赖性,在通过红外热成像的检查中会导致错误的检测。作为第一个问题,瓷砖墙受到背景反射的影响。第二个问题是,在检查高层建筑时,摄像机角度会随高度而变化。因此,需要揭示发射率和角度之间的关系。但是,关于它的数据很少。如果不解决这些问题,就不可能减少对瓷砖墙的错误检测。背景反射和发射率的角度依赖性。在这项研究中,对角度问题进行了研究。目的是建立一种针对红外热成像的发射率的角度依赖性的修正方法。为了揭示发射率和角度之间的关系,通过FT-IR和红外热像仪测量了瓷砖在不同角度下的光谱发射率。将这两个实验结果与理论公式中的发射率-角度曲线进行了比较。在短波长范围内,两个实验结果显示出相似的行为,但与理论曲线不一致。这将是进一步研究的主题。在长波长范围内,两个实验结果几乎都遵循理论曲线。这意味着对于长波长范围,可以修改光谱发射率的角度依赖性。

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