首页> 外文会议>Symposium on Nondestructive Methods for Materials Characterization held November 29-30, 1999, Boston, Massachusetts, U.S.A. >Impedance spectroscopy investigation on the low-temperature degradation of tetragonal zirconia: influence of measurement conditions
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Impedance spectroscopy investigation on the low-temperature degradation of tetragonal zirconia: influence of measurement conditions

机译:四方氧化锆低温降解的阻抗谱研究:测量条件的影响

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Impedance s pectroscopy has been used for the characterization the low-temperature degradation of yttria-stabilized tetragonal zirconia polycrystals in a non-destructive assay. Superficial transformation resulting from annealing in air lead to the appearance of an extra relaxation in the imedance spectra which evolves with degradation extent. It has been demonstrated that in situ electrical characterization cnannot be performed because the electrode layers retard the degradation phenomenon. The ideal temperature/time condition to record spectra is also discussed.
机译:阻抗光谱法已用于在非破坏性测定中表征氧化钇稳定的四方氧化锆多晶的低温降解。在空气中退火导致的表面转变导致阻抗谱出现额外的松弛现象,并随降解程度的发展而变化。已经证明,由于电极层阻碍了降解现象,所以不能进行原位电表征。还讨论了记录光谱的理想温度/时间条件。

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