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Temperature-dependent Operation of Ge on Si p-I-n Photodetectors

机译:Si p-I-n光电探测器上Ge的温度依赖性操作

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摘要

We investigate the temperature dependence of p-I-n photodetectorsrnrealized in germanium on silicon. The dark current increases by arnfactor 1.6÷1.9 every 10℃ and is typically dominated by generationrnin the space charge region, with diffusion contributing in the bestrnsamples. The NIR responsivity decreases with temperature inrndevices with a large defect-density, but is more stable in highrnquality photodiodes. These findings provide a relevant insight onrnthe design Ge-on-Si NIR detectors to be operated above roomrntemperature.
机译:我们研究了在硅上锗中实现的p-I-n光电探测器的温度依赖性。暗电流每10℃增加一个因数1.6÷1.9,并且通常由空间电荷区域中的生成所控制,而扩散会影响最佳样本。 NIR响应度随缺陷密度大的温度器件而降低,但在高质量光电二极管中更稳定。这些发现为在室温以上运行的Ge-on-Si近红外探测器的设计提供了相关的见识。

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  • 会议地点 Honolulu HI(US);Honolulu HI(US)
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    NooEL- Nonlinear Optics and OptoElectronics Lab INFM-CNISM and Department of Electronic Engineering University "Roma Tre"Via della Vasca Navale 84, 00146 Rome – Italy;

    NooEL- Nonlinear Optics and OptoElectronics Lab INFM-CNISM and Department of Electronic Engineering University "Roma Tre"Via della Vasca Navale 84, 00146 Rome – Italy;

    NooEL- Nonlinear Optics and OptoElectronics Lab INFM-CNISM and Department of Electronic Engineering University "Roma Tre"Via della Vasca Navale 84, 00146 Rome – Italy;

    NooEL- Nonlinear Optics and OptoElectronics Lab INFM-CNISM and Department of Electronic Engineering University "Roma Tre"Via della Vasca Navale 84, 00146 Rome – Italy;

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