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Surface-state charge fluctuations on the carrier dynamics in InGaN/GaN blue light-emitting diodes with multiquantum barriers

机译:具有多量子势垒的InGaN / GaN蓝色发光二极管中的表面态电荷波动对载流子动力学的影响

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In this article, we investigate the anomalous temperature characteristics of InGaN/GaN multiple quantum-well (MQW) blue light emitting diodes (LEDs), with multiquantum barriers (MQBs) and GaN barriers, in depth via an examination of the luminescence intensity and carrier transport temperature evolution. The experimental evidences for electrical properties of two diodes exhibited the ideality factor extremely departure from unity, and the anomalies were characterized by pseudo-temperature T_o and carrier tunneling behavior. With respect to conventional GaN barrier devices, devices with MQBs inherently exhibit a small pseudo-temperature T_o with a small characteristic energy and charge population of the multilayer interface, over a variety of temperature and voltage ranges. Due to the less interface state distribution and the more effective density of state (DOS), the excitons formed in the MQB sample augment the spectral radiations at the temperature higher than 180 K. Furthermore, the carrier tunneling processes via the extent of the charge population consequently cause anomaly more T_o and further characteristic energy, result in the abnormal deterioration of the EL intensities with small DOS for these two LEDs below 180 K. These results also demonstrate that an introduction of well-designed barriers within a heterojunction configuration can be used to perform device improvements by governing the coupling of dynamical transports to spontaneous emissions. All observed correlations suggest that the carrier transport process is essentially responsible for the improvement of the luminescence characteristic. Accordingly, the MQW with the well-designed MQB structures not only exhibited the thermal-insensitive luminescence, but also inhibited the energetic carrier overflow.
机译:在本文中,我们通过检查发光强度和载流子深度研究了具有多量子势垒(MQB)和GaN势垒的InGaN / GaN多量子阱(MQW)蓝色发光二极管(LED)的异常温度特性。运输温度的演变。两个二极管的电学特性的实验证据显示出理想因子极度地偏离了单位,并且以伪温度T_o和载流子隧穿行为为特征。关于常规的GaN势垒器件,具有MQB的器件固有地表现出小的伪温度T_o,在各种温度和电压范围内,该伪温度T_o具有小的多层界面的特征能量和电荷种群。由于界面状态分布较少且状态密度(DOS)更有效,MQB样品中形成的激子在高于180 K的温度下增加了光谱辐射。此外,载流子的隧穿过程取决于电荷的分布因此会导致异常更多的T_o和更多的特征能量,导致这两个180 K以下LED的DOS较小的DOS的EL强度异常降低。这些结果还表明,在异质结配置中引入设计良好的势垒可用于通过控制动态传输与自发辐射的耦合来执行设备改进。所有观察到的相关性表明,载流子传输过程主要负责发光特性的改善。因此,具有精心设计的MQB结构的MQW不仅表现出对热不敏感的发光,而且抑制了高能载流子的溢出。

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