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Strain-Compensated p-Channel InGaP/InGaAs Heterostructure Field-Effect Transistors

机译:应变补偿p沟道InGaP / InGaAs异质结构场效应晶体管

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摘要

Undoped strain-compensated In_(0.36)Ga_(0.64)P/In_(0.20)Ga_(0.80)As structures were fabricated into p-channel heterostructure field-effect transistors (HFETs) through Zn implantation. Their device results are shown to be better than those of strain-uncompensated In_(0.48)Ga_(0.52)P/In_(0.20)Ga_(0.80)As p-channel HFETs.
机译:通过Zn注入将未掺杂的应变补偿In_(0.36)Ga_(0.64)P / In_(0.20)Ga_(0.80)As结构制成p沟道异质结构场效应晶体管(HFET)。结果表明,它们的器件结果优于无应变In_(0.48)Ga_(0.52)P / In_(0.20)Ga_(0.80)As p沟道HFET的结果。

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