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Bias-dependent Photoabsorption Properties of GaN Porous Structures under Back-side Illumination

机译:背面照明下GaN多孔结构的偏压依赖性光吸收特性

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Photoabsorption properties of GaN porous structures were investigated by measuring photocurrent and light transmittance under monochromatic light with various wavelengths. The measured photocurrents on the porous GaN electrode were larger than those on the planar electrodes, and those were observed even under illumination with lower photon energy than the bandgap energy of bulk GaN. Moreover, the light transmittance that was measured in the back-side illumination (BSI) mode depended strongly on the applied voltage to the porous electrode with change of the photocurrents. The observed photoabsorption properties can be qualitatively explained by the Franz-Keldysh effect; namely, the high electric field induced in the GaN porous structure easily causes a redshift of the photoabsorption edge.
机译:通过在各种波长的单色光下测量光电流和透光率,研究了GaN多孔结构的光吸收特性。在多孔GaN电极上测得的光电流大于在平面电极上测得的光电流,即使在光子能量低于块状GaN的带隙能量的照明下也能观察到光电流。而且,在背照(BSI)模式下测量的透光率在很大程度上取决于随着光电流的变化施加到多孔电极的电压。 Franz-Keldysh效应可以定性解释观察到的光吸收特性。即,在GaN多孔结构中感应的高电场容易引起光吸收边缘的红移。

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    Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Kita 13, West 8, Kita-ku, Sapporo 060-8628, Japan;

    Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Kita 13, West 8, Kita-ku, Sapporo 060-8628, Japan;

    Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Kita 13, West 8, Kita-ku, Sapporo 060-8628, Japan;

    Research Center for Integrated Quantum Electronics (RCIQE), Hokkaido University, Kita 13, West 8, Kita-ku, Sapporo 060-8628, Japan;

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