POLARIZATION-DEPENDENT OPTICAL PROPERTIES OF POROUS SILICON BASED MULTILAYER STRUCTURES AND MICROCAVITIES

摘要

One-dimensional photonic crystal microcavities formed from porous silicon layers were analyzed theoretically for different angles of incidence and different polarization of light. The effect of minimal reflectance at Brewster angle was observed for the reflection of the structures for p-polarized light. The Frehnel fringes were strongly suppressed and the microcavity resonance was enhanced at the angle near the Brewster one. The experimental spectra demonstrate more complex behaviour of the reflectance of the porous-silicon based multilayer structures which can be explained considering the polarization-dependent properties and the real feature light scattering and absorbance of porous silicon layers.