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The role of electron temperature in the leakage current in QCLs and its impact on the quantum efficiency

机译:电子温度在QCL漏电流中的作用及其对量子效率的影响

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We have recently described a method to analyze the leakage current (J_(leak)) in quantum-cascade lasers (QCLs) for carriers scattering into higher minibands due to LO-phonon absorption. In his presentation we analyze J_(leak) due to elastic scattering. We illustrate how at low temperature, when inelastic scattering is negligible, this current becomes significant for devices operating at high electron temperatures. Measuring J_(leak) above threshold we are able to investigate the effect of electron temperature on the differential quantum efficiency. This procedure is supported by a self-consistent calculation of the rate equations based on a phenomenological scattering-rate model. We apply our approach and measure J_(leak) above threshold as a function of electron temperature for a QCL emitting near 5.4 μm operated at a low duty cycle and a heat sink temperature of 80 K. This current is then modeled using a thermally activated, electron temperature-driven, scattering model based on intersubband interface roughness scattering. As a result, a reduction in the upper laser state population by ~35% is estimated due to the effect of increased electron temperature. A decrease of the quantum efficiency of ~ 80% is estimated for an electron temperature of 400 K.
机译:我们最近描述了一种方法,用于分析量子级联激光器(QCL)中的漏电流(J_(leak)),以了解由于LO声子吸收而导致的载波散射到更高的微带中的情况。在他的演讲中,我们分析了由于弹性散射引起的J_(leak)。我们说明了在低温下如何忽略非弹性散射时,此电流对于在高电子温度下工作的设备变得非常重要。通过测量高于阈值的J_(leak),我们能够研究电子温度对微分量子效率的影响。该过程由基于现象散射速率模型的速率方程的自洽计算支持。我们采用我们的方法,测量在低占空比和80 K散热器温度下发射的5.4μm附近的QCL的电子温度的函数,确定高于阈值的J_(泄漏)作为电子温度的函数。然后使用热激活模型模拟该电流,电子温度驱动的基于子带间界面粗糙度散射的散射模型。结果,由于电子温度升高的影响,估计高激光态种群减少了约35%。对于400 K的电子温度,估计量子效率降低约80%。

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