SFM-BASED METHODS FOR FERROELECTRIC STUDIES

摘要

Rapid development of ferroelectric-based devices generated a strong need for extensive investigation of the nanoscale properties of ferroelectric materials. Application of scanning force microscopy to ferroelectrics opened new possibilities not only for their high-resolution characterization, but also for control of ferroelectric properties at the nanoscale. This paper presented a review of the recent advances in this field. It would not be an exaggeration to say that SFM had allowed a breakthrough in studying such problems as the basic mechanism of polarization reversal in ferroelectric films, mechanisms of degradation effects, reconstruction of domain structure in ferroelectric films at the sub-grain level and other problems of fundamental and technological importance. SFM of ferroelectrics has a very strong potential in fabrication of functional nanostructures.