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Atomic Scale Investigation of Impurity 3D Distribution in Nanocrystalline Ni Processed by SPD

机译:SPD处理纳米晶Ni中杂质3D分布的原子尺度研究

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Some nanocrystaline Ni was prepared by repeated cold rolling with intermediate folding (F&R). The material was then processed by High Pressure Torsion (HPT) to study the grain evolution under additional Severe Plastic Deformation (SPD). Microstructures were characterized by Transmission Electron Microscopy (TEM) and the impurity distribution was analyzed by Atom Probe Tomography (APT). In this paper, we discuss about the influence of impurities on the grain growth during HPT and on the grain size reduction mechanism during SPD.
机译:通过具有中间折叠(F&R)的反复冷轧来制备一些纳米晶Ni。然后通过高压扭转(HPT)对材料进行处理,以研究在附加的严重塑性变形(SPD)下晶粒的演化。通过透射电子显微镜(TEM)对微观结构进行表征,并通过原子探针层析成像(APT)分析杂质分布。在本文中,我们讨论了杂质对HPT期间晶粒生长的影响以及对SPD期间晶粒尺寸减小机理的影响。

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