North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China;
North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China;
North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China;
The 13~(th) Research Institute, CETC, Shijiazhuang 050051, P. R. China;
North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China;
North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China,Key Laboratory of Instrumentation Science Dynamic Measurement (North University of China), Ministry of Education Taiyuan 030051, P. R. China;
North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China,Key Laboratory of Instrumentation Science Dynamic Measurement (North University of China), Ministry of Education Taiyuan 030051, P. R. China;
GaN; HEFT; temperature-dependence; I-V characteristic; gravity;
机译:AlGaN势垒层变化对GaN / AlGaN HEMTS射频性能的依赖性
机译:发行者注:“通过特殊设计的AIGaN / GaN超晶格电子阻挡层增强了蓝色发光二极管的性能” [Appl。物理来吧99,221103(2011)]
机译:特殊设计的AIGaN / GaN超晶格电子阻挡层增强了蓝色发光二极管的性能
机译:AlGaN / GaN Heft-Micro-Incorerometer和温度依赖电气性能的设计
机译:AIGaN / GaN基气体传感器中电极催化反应的电响应的表征和建模。
机译:厚度取决于在c面GaN上沉积的原子层中AlN的界面和电学性质
机译:AIGAN / GAN异质结构的蓝宝石底物上GAN EPI层的电气特性
机译:高压aIGaN / GaN HFET中的物理建模和可靠性机制。