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The Design of AIGaN/GaN HEFT-micro-accelerometer and Temperature- dependence Electrical Performance

机译:AIGaN / GaN HEFT微加速度计的设计和温度相关的电性能

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摘要

In this paper, We use a novel principle to detect acceleration and report how I-V characteristics and piezoresistance coefficient of AlGaN/GaN HEFT-micro-accelerometer are affected by setting different temperatures. It is shown that saturation current of device would go down if the temperature goes up, which is about 0.028mA/℃, based on the research. However, the device can work well at the temperature range of -50℃ to 50℃, which indicates that it can work safely in the larger temperature range.
机译:在本文中,我们使用新颖的原理来检测加速度,并报告设置不同温度如何影响AlGaN / GaN HEFT微加速度计的I-V特性和压阻系数。研究表明,温度升高会使器件的饱和电流下降,约为0.028mA /℃。但是,该设备可以在-50℃至50℃的温度范围内正常工作,这表明它可以在较大的温度范围内安全工作。

著录项

  • 来源
  • 会议地点 Xian(CN);Xian(CN)
  • 作者单位

    North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China;

    North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China;

    North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China;

    The 13~(th) Research Institute, CETC, Shijiazhuang 050051, P. R. China;

    North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China;

    North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China,Key Laboratory of Instrumentation Science Dynamic Measurement (North University of China), Ministry of Education Taiyuan 030051, P. R. China;

    North University of China, National Key Laboratory of Science and Technology on Electronic Test and Measurement Taiyuan 030051, P. R. China,Key Laboratory of Instrumentation Science Dynamic Measurement (North University of China), Ministry of Education Taiyuan 030051, P. R. China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 光学仪器;微电子学、集成电路(IC);
  • 关键词

    GaN; HEFT; temperature-dependence; I-V characteristic; gravity;

    机译:氮化镓; HEFT;温度依赖性I-V特性;重力;

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