Speckle interferometry based on spatial fringe analysis method using only two speckle patterns

摘要

Electronic speckle pattern interferometry is a useful deformation measurement method. In this paper, new speckle interferometry that can measure the deformation with a concave shape distribution based on spatial fringe analysis method by using only two speckle patterns is proposed. The optical system that can record some spatial information into each speckle of speckle pattern is set up by using basic characteristics of speckle phenomenon that has never been used before. In experimental results, it is confirmed that the out-of-plane deformation measurement by using only two speckle patterns before and after the deformation can be precisely performed by this method.