首页> 外文会议> >Accurate Profile Measurement by an Interferometer
【24h】

Accurate Profile Measurement by an Interferometer

机译:干涉仪精确测量轮廓

获取原文
获取原文并翻译 | 示例

摘要

For the pupose of improving measurement accuracy in interferometry, a lot methods have been proposed to separate the form error in the reference optics from that in the test optics. The best known one is the three-plate method~(1)(2) in which multiple measurements to three plates combined in pairs are carryed out. The unknown form error in the test optics can be evaluated through the calucation of the measurement resutls. However, multiple measurements across several lines and the cobination of these individual sets of data are considered to lead to a loss of precision. In another method proposed by Schulz and Elssner~(3), three positions, including the basic position, rotated position and cat's eye position, were used between the reference optics and the test optics. With a comprebensive calcualtion of data at these positions, the unknown form error in the test optics can be evaluated in spite of that in the reference surface.
机译:为了提高干涉测量中的测量精度,已经提出了许多方法来将参考光学器件中的形状误差与测试光学器件中的形状误差分开。最为人所知的是三板法〜(1)(2),其中对成对组合的三块板进行多次测量。可以通过计算测量结果来评估测试光学器件中的未知形状误差。但是,跨几条线的多次测量以及这些单独数据集的组合被认为会导致精度损失。在Schulz和Elssner〜(3)提出的另一种方法中,在参考光学器件和测试光学器件之间使用了三个位置,包括基本位置,旋转位置和猫眼位置。通过在这些位置上进行全面的数据计算,尽管在参考表面中存在误差,也可以评估测试光学器件中的未知形状误差。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号