In-operando X-ray reflectivity studies on temperature responsesof ultrathin polymer films

摘要

The revolution of the analysis technique would be one of the most activity engine forthe materials science,especially the development of the in-operando analysis technique.With the recording of the states of sample in the different environments,the in-situ dynamicstudy of the functional material system becomes favorable,and as the development of theresolution of data recording,the kinetic study can be also conducted simultaneously.However,with the increasing requirements from the academic and industry,the developingof materials science was stranding by the barriers of technique.For example,in thesemiconductor industry,many characterizing of the products cannot be conducted in theirfactory and have to only be conducted in the large facility,such as the synchrotron.However,the most useful information is still the states of the product during the annealingor etching in the production line.Thus,the development of the in-operando analysistechnique for laboratory condition is always promising.