首页> 外文会议>International Conference on Condensed Matter and Applied Physics >SrBi_4Ti_4O_(15) Aurivillius Phase Thin Films by Pulsed Laser Deposition using Nd:YAG Laser
【24h】

SrBi_4Ti_4O_(15) Aurivillius Phase Thin Films by Pulsed Laser Deposition using Nd:YAG Laser

机译:SRBI_4TI_4O_(15)AURIVILLIUS相薄膜通过ND:YAG激光器脉冲激光沉积

获取原文

摘要

We have synthesized the pure Aurivillius phase material in bulk by solid state route and in thin films by using pulsed laser deposition (PLD). Powder XRD and grazing incidence XRD (GIXRD) were used for phase purity confirmation. Thicknesses of the films were calculated from the x-ray reflectivity (XRR) curves. We show controlled thickness deposition of these natural superlattice films which can be used for various applications.
机译:通过使用脉冲激光沉积(PLD),我们通过固态途径和薄膜在块状物中堆积了纯Aurivillius相材料。粉末XRD和放牧发生XRD(GixRD)用于相纯度确认。从X射线反射率(XRR)曲线计算薄膜的厚度。我们显示了可用于各种应用的自然超晶格薄膜的受控厚度沉积。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号