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Development of Fault Diagnosis System using Fault Injection For Discrete Architectures

机译:不同架构故障注射故障诊断系统的开发

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Physical realization of momentous electronic circuit elements have becomes possible due to the avant-garde integration technology. Such components are propitiously providing high speed data execution with least power utilization in highly optimized area. With such attainment, fault diagnosis becomes significant in order to provide reliable product to the end user. The present research work introduces a methodology to evaluate the testability of the digital circuit. In the proposed work, the architecture is developed which produces expected output combinations and output combinations which are possible when fault condition occurs in the circuit. The architecture is implemented using VLSI-FPGA architecture, famous for implementing concurrent architecture and is targeted to Virtex FPGA for best optimization.
机译:由于前卫集成技术,重型电子电路元件的物理实现变得可能。这些组件在高度优化的区域中能够在最低功耗利用中提供高速数据执行。通过此类实现,故障诊断变得显着,以便为最终用户提供可靠的产品。本研究工作介绍了一种评估数字电路可测试性的方法。在拟议的工作中,开发了该架构,其产生预期的输出组合和输出组合,当电路中发生故障状态时可能是可能的。该架构是使用VLSI-FPGA架构实现的,该架构以实现并发架构而闻名,并针对Virtex FPGA以获得最佳优化。

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