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Effect of Sintering Parameters and Ta_2O_5 Doping on the Microstructure and Dielectric Properties of BaTiO_3 Based Ceramics

机译:烧结参数和Ta_2O_5掺杂对Batio_3陶瓷的微结构和介电性能的影响

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The main focus of the research was to correlate the composition and sintering parameters with the microstructure and dielectric properties of Ta_2O_5 (Tantalum Oxide) doped BaTiO_3 (Barium Titanate) ceramics. Ta_2O_5 was doped at three different percentages viz. 0.5, 1.0 and 1.5 mole%. The doped samples were then sintered using both single and double stage sintering techniques. Thereafter field emission scanning electron microscope (FESEM) and X-ray diffraction (XRD) techniques were used to examine the structure of the samples with particular focus on the incorporation of Ta~(5+) ions into the BaTiO_3 crystal lattice. Finally, the dielectric properties were analyzed using impedence analyzer and the relationship between the properties and structure of doped BaTiO_3 was established. From the research, it can be stated that double stage sintering yielded best dielectric properties. The best stable value of room temperature dielectric constant (k) of 19000 was obtained for 1.5 mole% Ta_2O_5 Doped BaTiO_3 sample, sintered at 1320°C for 0 minutes and 1280°C for 360 minutes due to the combination of high percent theoretical density (%TD) and optimum grain size. At a temperature range of 30°C to 60°C, this combination of composition and sintering parameters yielded dielectric constant in the range of 18000-19000.
机译:研究的主要重点是将组合物和烧结参数与Ta_2O_5(氧化钽)掺杂BATIO_3(钛酸钡)陶瓷的微观结构和介电性能相关联。 Ta_2O_5以三种不同的百分比掺杂。 0.5,1.0和1.5摩尔%。然后使用单阶和双级烧结技术烧结掺杂样品。此后,使用现场发射扫描电子显微镜(FeSEM)和X射线衍射(XRD)技术来检查样品的结构,特别关注将Ta〜(5+)离子掺入BATIO_3晶格中。最后,使用阻抗分析仪分析介电性质,建立了掺杂BATIO_3的性质与结构之间的关系。从研究来看,可以说双级烧结产生最佳的介电性能。室温介电常数(k)的最佳稳定值为19000,得到1.5摩尔%的Ta_2O_5掺杂的BATIO_3样品,烧结在1320℃下烧结0分钟,1280℃,由于理论密度高的百分比( %TD)和最佳晶粒尺寸。在30℃至60℃的温度范围内,这种组合物和烧结参数的组合在18000-19000的范围内产生介电常数。

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