REDUCTION OF SECONDARY ELECTRON YIELD (SEY) FIGURES ON SMOOTH METALLIC SURFACES BY MEANS OF MAGNETIC ROUGHNESS

摘要

High secondary electron yield of metallic surfaces used in accelerator and also in space applications is of general concern. In addition to several well-known coating preparation techniques and microscopic or macroscopic mechanical roughness (grooves) which may significantly increase microwave losses the concept of magnetic surface roughness has been proposed recently to lower the effective secondary electron yield (SEY). In this concept a smooth and very good conducting surface with low microwave losses is maintained, but underneath this surface a large number of tiny permanent magnets are located to build a rough magnetic equipotential structure. In this paper we present and discuss measurement of the SEY and the improvement in terms of SEY for different parameter ranges.