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Effect of tool coatings on surface grain refinement in orthogonal cutting of AISI 4140 steel

机译:工具涂层对AISI 4140钢正交切割表面晶粒细化的影响

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Recrystallization mechanisms leading to the generation of ultrafine grains(UFG)by surface severe plastic deformation(S2PD)at low temperatures(<0.5Tm(melting temperature))have been investigated over the last years.Material removal processes like broaching impose large plastic strains along the shear plane during chip formation,leading in many cases to changes in the workpiece subsurface microstructure.In this work the influence of the cutting material on surface grain recrystallization were studied on broaching of AISI 4140q&t steel.Orthogonal cutting tests were carried out in dry conditions on a broaching machine using tools with different coatings Uncoated cemented carbide inserts were geometrically prepared using fixed abrasive grinding processes and then coated by physical vapor deposition(PVD)with Al2O3 and CrVN thin films.Workpiece subsurface layers were analyzed after machining by Focused Ion Beam(FIB-SEM)and X-ray diffraction(XRD).The presented results show the influence of the cutting material on the final microstructure of the machined workpieces through the determination of the final grain sizes and dislocation densities.
机译:在过去几年中研究了在低温下通过表面严重塑性变形(S2PD)产生超细晶粒(S2PD)的重结晶机制(S2PD)。在过去几年中,已经研究了如拉削的材料去除方法施加大型塑料菌株剪切平面在芯片形成期间,在许多情况下导致工件地下微观结构的变化。在这项工作中,研究了切割材料对AISI 4140Q&T钢的拉伸对表面晶粒重结晶的影响。正交切削测试在干燥条件下进行在使用具有不同涂层的工具的拉伸机上,使用固定磨料研磨方法在几何制备,然后通过用Al 2 O 3和Crfn薄膜涂覆的物理气相沉积(PVD)涂覆。通过聚焦离子束加工后分析Working Puece地下层( fib-sem)和X射线衍射(XRD)。所提出的结果表明了影响的影响通过确定最终晶粒尺寸和位错密度的加工工件的最终微观结构切割材料。

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