TEST AND DIAGNOSIS MODEL OF COMPLICATED INTEGRATED CIRCUIT WITH CPU

摘要

Focus on the problem that test signals is difficult to describe in the microprocessor (CPU) and digital signal processor (DSP) circuit, this paper proposes a matrix base method to describe program signal and instruction signal, thus in theory solve the above problem. In the proposed method, simple hardware circuit can be used to produce different test signal needed in the test and diagnose of CPU circuit.