Research on Interval Pulse IV Test Method for Power Semiconductor Devices

摘要

This paper did carefully research on the principle of point test method for semiconductor devices testing, and pulse step current source and voltage source was developed. Verification system of the interval pulse IV test method was developed to identify the relationship of the pulse width and interval time of Interval pulse IV test method. The specification of this system is vivificated through evaluating the uncertainties of the system. Then standard protocol of the interval pulse IV test method for power semiconductor devices is fulfilled.