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Microstructure and Magnetic Properties of Fe and Fe-alloy Thin Films Epitaxially Grown on MgO(100) Substrates

机译:在MgO(100)基材上外延生长的Fe和Fe-Alloy薄膜的组织和磁性

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Fe, Fe_(50)Co_(50), and Fe_(80)Ni_(20) (at. %) single-crystal films with the (100)_(bcc) plane parallel to the substrate surface were prepared on MgO(100) single-crystals heated at 300 °C by ultra high vacuum molecular beam epitaxy. The film growth mechanism, the film structure, and the magnetic properties were investigated. In-situ reflection high energy electron diffraction and X-ray diffraction analyses indicate that the strains in the films are very small though there are fairly large mismatches of -3.7~-4.3% at the film/substrate interface. Cross-sectional high-resolution transmission electron microscopy shows that misfit dislocations are introduced in the film at the interface. Dislocations are also observed in the film up to around 10~20 nm distance from the interface. The presence of such dislocation relieves the strain caused by the lattice mismatch. The in-plane magnetization properties of these films reflect the magnetocrystalline anisotropics of respective bulk Fe, Fe_(50)Co_(50), and Fe_(80)Ni_(20) crystals.
机译:在MgO上制备平行于基板表面的(100)_(BCC)平面的FE,FE_(50)CO_(50)和FE_(80)NI_(20)(AT。%)单晶膜(100) )通过超高真空分子束外延在300℃下加热的单晶。研究了薄膜生长机理,膜结构和磁性。原位反射高能量电子衍射和X射线衍射分析表明,薄膜中的菌株非常小,但在胶片/基板界面处的相当大的错配-3.7〜4.3%。横截面高分辨率透射电子显微镜表明,在界面的薄膜中引入了错配位错。在距界面的距离高达约10〜20nm的膜中也观察到脱位。这种位错的存在缓解了格式错配引起的应变。这些薄膜的面内磁化性能反映了各自的散装Fe,Fe_(50)CO_(50)和Fe_(80)Ni_(20)晶体的磁镀晶各向异性。

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