Voltage Dips Test System According to IEC 61000-4-11

摘要

Voltage dips analysis is a complex stochastic issue, since it involves a large variety of random factors, such as: type of short-circuits in the power system, location of faults, protective system performance and atmospheric discharges. Among all categories of electrical disturbances, the voltage dips (sags) and momentary interruptions are the nemeses of the automated industrial process. This paper describes a system for voltage dips testing according to IEC 61000-4-11 norm. The system equipment is described also with the test process. Results are represented in power acceptability curves such as the Computer Business Equipment Manufacturing Association (CBEMA) curve and the Information Technology Industry Council (ITIC) curve.