首页> 外文会议>Conference X-ray Universe >THE GROUND CALIBRATION OF THE BACK-SIDE ILLUMINATED CCD CAMERA OF X-RAY IMAGING SPECTROMETER (XIS) ONBOARD ASTRO-E2 (SUZAKU)
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THE GROUND CALIBRATION OF THE BACK-SIDE ILLUMINATED CCD CAMERA OF X-RAY IMAGING SPECTROMETER (XIS) ONBOARD ASTRO-E2 (SUZAKU)

机译:X射线成像光谱仪(XIS)板载Astro-E2(Suzaku)的​​后侧照明CCD摄像机的地面校准

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We report on the results of the ground calibration of the back-side illuminated (BI) Charge-Coupled Device (CCD) onboard Suzaku(Astro-E2). The BI CCD has higher quantum efficiency (QE) below ~4keV than Front-side illuminated (FI) CCDs. By chemisorption charging process, furthermore, the BI chip achieved very good energy resolution comparable to the FI chip. However, several problems were found by our ground calibration. One of them is charge trailing, and we corrected this phenomenon by a newly developed method, "Charge Trail Correction". Another problem is that the constant split threshold, a key parameter for the Grade method, gives a poor performance for the BI chip. Thus we introduced a new Grade method with a variable split threshold depending on the incident X-ray energy. Analyzing the ground calibration data with these new methods, we built the response function of BI CCD.
机译:我们报告后侧照明(BI)电荷耦合器件(CCD)船上的地板校准的结果(Astro-e2)。 BI CCD在低于〜4KeV的量子效率(QE)比前侧照射(FI)CCD更高。通过化学吸取充电过程,BI芯片实现了与FI芯片相当的非常好的能量分辨率。但是,我们的地面校准发现了几个问题。其中一个是充电尾随,我们通过新开发的方法“充电跟踪校正”来纠正这种现象。另一个问题是,常量分离阈值是等级方法的关键参数,对BI芯片的性能差。因此,我们引入了一种具有可变分割阈值的新​​级方法,具体取决于入射X射线能量。使用这些新方法分析地面校准数据,我们构建了BI CCD的响应功能。

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