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Relationship of basal plane and prismatic stacking faults in GaN to low temperature photoluminescence peaks at approx 3.4 eV and approx 3.2 eV

机译:GaN中基底平面和棱柱堆垛机的关系在大约3.4eV和约3.2eV的低温光致发光峰值中的关系

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The relationship between the optical properties and microstructure of GaN is of great interest due to the important optical and electronic applications of this material.Several different studies have been reported attempting to link the low temperature photoluminescence (PL) peak at approx 3.4 eV to the presence of various microstructural defects.However,no clear systematic studies have been reported establishing such a link for the PL peak observed at approx 3.2 eV.In this paper,we present evidence linking the approx 3.4 eV PL peak to the presence of a thin layer of cubic phase associated with basal plane stacking faults (BSF).This relationship is mainly established by studying a series of ammonothermally-grown GaN bulk crystals.The existence and strength of the approx 3.4 eV peak are found to be related to the I_2 type BSF (R_(I2)=l/3<1010>) observed in these samples.To investigate the relationship between the approx 3.2 eV peak and structural defects,a series of GaN epilayers grown on either SiC or sapphire (of various off-cut angles) was investigated by TEM and PL spectroscopy.Samples grown on 3.5~° off-cut SiC and 5~° and 9~° off-cut sapphire substrates exhibit PL peaks near approx 3.2 and approx 3.4 eV,which are absent in the on-axis SiC and sapphire cases.TEM shows that the former group of samples has defect configurations consisting of prismatic stacking faults (PSFs) folding back and forth between two different {1120} planes connected by stair rod dislocations,which in turn fold onto to I_1 type BSFs again with stair rod dislocations at the fault intersections.The approx 3.2 eV PL peaks are proposed to possibly arise from transitions involving the PSFs and the stair rods associated with their mutual intersections and their intersections with the BSFs.The -3.4 eV peak is again attributed to the thin layer of cubic phase associated with the I_1 type BSF (three bilayers as opposed to four bilayers for the I_2 type BSF).
机译:由于这种材料的重要光学和电子应用,GaN的光学性质和微观结构之间的关系很大。已经报道了不同的​​研究,试图将低温光致发光(PL)峰值在大约3.4eV上链接到存在无论多种微观结构缺陷。据报道,没有明确的系统研究,为大约3.2 eV观察到的PL峰确立了这样的链路。在本文中,我们呈现了将大约3.4 eV PL峰与薄层的存在连接的证据与基面堆垛层错(BSF)相关联的立方相。这关系主要通过研究一系列氨热生长的GaN体crystals.The存在和大约3.4eV的峰的强度的建立被发现进行相关的I_2型BSF(在这些样本中观察到的R_(I2)= L / 3 <1010>调查大约3.2 eV峰值和结构缺陷之间的关系,一系列GAN epilayers成长通过TEM和PL光谱研究了SiC或Sapphire(各种切割角度)。在3.5〜°切割SiC和5〜°和9°和9°和9°剪切蓝宝石衬底上的SiCples,PL峰接近约3.2和大约3.4eV,在轴上SIC和SAPPHIRE案例中缺席。显示前一组样本具有缺陷配置,包括棱镜堆叠故障(PSF)来回折叠两种不同{1120}平面之间的折叠阶梯杆脱位,其在故障交叉点处再次折叠到I_1型BSFS。提出了大约3.2VPL峰值,从涉及PSF和与其相互交叉口相关的楼梯杆的过渡可能产生与BSFS的交叉点。-3.4eV峰值再次归因于与I_1型BSF相关联的立方相位薄层(三个双层,而不是用于I_2型BSF的四双层)。

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