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Three dimensional photothemal microscopy of KDP crystals

机译:KDP晶体的三维光学显微镜显微镜

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The laser damage threshold of KDP crystals is one major limitation in many high-power laser systems. Investigation of laser damage behavior of KDP crystals shows that the major reason for the laser damage is due to growth defects in the bulk of the crystals. Therefore, an effective diagnostic method for those defects is quite necessary for producing KDP crystals with high enough damage threshold to meet the requirement of high power laser applications. In this paper, we reported characterization of bulk defects in KDP crystals using a three dimensional photothermal microscope based on a laser-induced photothermal lensing technique. Several 3D images of the bulk defects were obtained. The results indicated that both surface defects and bulk defects can be determined and analyzed using the 3-D photothermal microscope. Details of development of the 3-D photothermal microscope were also presented. The system provided user-friendly operations of the defects characterization process and showed great potential of application for characterization of low absorption optical materials.
机译:KDP晶体的激光损伤阈值是许多高功率激光系统中的一个主要限制。 KDP晶体激光损伤行为的调查表明激光损伤的主要原因是由于晶粒中的生长缺陷。因此,对于这些缺陷的有效诊断方法非常有必要生产具有足够高的损伤阈值的KDP晶体,以满足高功率激光应用的要求。本文通过基于激光诱导的光热透镜技术报告了使用三维光热显微镜的KDP晶体中散装缺陷的表征。获得了散装缺陷的几个3D图像。结果表明,可以使用3-D光热显微镜确定和分析表面缺陷和散装缺陷。还提出了3-D光热显微镜的发展细节。该系统提供了缺陷表征过程的用户友好操作,并显示了用于表征低吸收光学材料的应用潜力。

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