Dual-wavelength diffraction phase microscopy for real-time dispersion measurement

摘要

We present a dual-wavelength diffraction phase microscopy (DW-DPM) that obtains the wavelength-differentiated dual phase images in a single shot of interference fringe acquisition. For this, the diffraction phase microscopy (DPM) system was constructed with a transmission grating and a spatial filter that form a common-path interferometer. With a light source of two spectral components, a different diffraction order of the grating was utilized for each. This resulted in a combined but distinguishable interference pattern to be acquired by a single image sensor. In this research, our dual-wavelength phase imaging scheme was applied to simultaneously measure dispersion of a sample. Stable and reliable measurements could be performed in a single shot due to the robust structure of our DW-DPM system.