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An intracavity-enhanced dual-wavelength common-path phase microscopy imaging measurement system based on an F-P interferometer

机译:基于F-P干涉仪的腔内双波长共通相显微镜成像测量系统

摘要

#$%^&*AU2020101628A420200910.pdf#####ABSTRACT The present invention provides an intracavity-enhanced dual-wavelength common-path phase microscopy imaging measurement system based on an F-P interferometer. It is characterized by: it comprises a laser light source 1, an optical attenuator 2, a fiber coupler (LFC) 3, a single mode fiber 4, a fiber collimator (FCL) 5, an expander 6, an F-P interferometer 7, an object to be measured 8, a microscopic objective 9, a CCD detecting camera 10 and a computer 11. The present invention can be used for digital holography and refractive index measurements of microscopic objects, and can be widely used for three-dimensional microscopic imaging of refractive index of various microscopic objects.1/2 DRAWINGS 1-11 1-24-2 5 68 8 9 11 10 FIG. 1 1-2 FIG. 2
机译:#$%^&* AU2020101628A420200910.pdf #####抽象本发明提供了腔内增强的双波长共通相位基于F-P干涉仪的显微镜成像测量系统。其特点是:它包括激光光源1,光衰减器2,光纤耦合器(LFC)3,单模光纤4,光纤准直仪(FCL)5,扩展器6,F-P干涉仪7,待测物体被测物8,显微物镜9,CCD检测照相机10和计算机11。本发明可用于数字全息术和折射率测量。微观物体,可广泛用于三维显微成像各种微观物体的折射率。1/2图纸1-111-24-2568891110图。 1个1-2图。 2

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