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An intracavity-enhanced dual-wavelength common-path phase microscopy imaging measurement system based on an F-P interferometer
An intracavity-enhanced dual-wavelength common-path phase microscopy imaging measurement system based on an F-P interferometer
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机译:基于F-P干涉仪的腔内双波长共通相显微镜成像测量系统
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#$%^&*AU2020101628A420200910.pdf#####ABSTRACT The present invention provides an intracavity-enhanced dual-wavelength common-path phase microscopy imaging measurement system based on an F-P interferometer. It is characterized by: it comprises a laser light source 1, an optical attenuator 2, a fiber coupler (LFC) 3, a single mode fiber 4, a fiber collimator (FCL) 5, an expander 6, an F-P interferometer 7, an object to be measured 8, a microscopic objective 9, a CCD detecting camera 10 and a computer 11. The present invention can be used for digital holography and refractive index measurements of microscopic objects, and can be widely used for three-dimensional microscopic imaging of refractive index of various microscopic objects.1/2 DRAWINGS 1-11 1-24-2 5 68 8 9 11 10 FIG. 1 1-2 FIG. 2
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