Detection And Profiling Of Carbon Via The ~(13)C(P,γ)~(14)N Resonant Reaction

摘要

We have tested and standardized the profiling of ~(13)C in various substrates, including silicon, by use of the ~(13)C(p,γ)~(14)N resonance at 1.748 MeV. Depth resolution and interference factors will be shown. The large background due to silicon is not a significant difficulty for atomic concentrations of ~(13)C which are greater than 1%. Background from elements heavier than Si are present but not significant. We show the mechanical details and results of the analysis program ALLPROF which also develops depth profiles for the light elements H, Li, ~(11)B, ~(13)C, ~(14)N, ~(15)N, F, Na, Al and P. By extension, the program and our system can profile natural B, C and N via the assumed natural ratio of isotopes.