Single crystal growth and structural characterization of Cr doped Sb_(1.95)Cr_(0.05)Te_3 single crystal

摘要

We report the high quality single crystal growth and X-ray diffraction characterization studies of bulk Sb_(1.95)Cr_(0.05)Te_3 single crystals. Elemental analysis is confirmed by TEM EDX spectroscopy. Single crystal of Sb_(1.95)Cr_(0.05)Te_3 is grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planes reveal the growth of crystal along the c-direction. X-ray diffraction analysis using Rietveld refinement verifies the phase purity and confirms that the material crystalizes in a trigonal structure with R- 3m space group.