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In-Situ Isotropic and Anisotropic DRIE Sequence for Massive Parallel Multistage Brownian Ratchets

机译:用于大规模平行多级布朗棘轮的原位各向同性和各向异性DRIE序列

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In this paper an in-situ isotropic and anisotropic Deep Reactive Ion Etching (DRIE) sequence process is presented to obtain a periodic asymmetric variation along the z-axis in pore diameter on silicon wafers, which can act as massively parallel and multiply stacked Brownian ratchets. The etch rates of isotropic and anisotropic etching process depends strongly on the size and the shape of structures. The undercut phenomenon for small size structure (less than 2驴m) is investigated. Exposure into NH3 plasma after etching to smoothen the surface of silicon is discussed as well.
机译:在本文中,提出了一种原位各向同性和各向异性的深反应离子蚀刻(DRIE)序列工艺以在硅晶片上获得沿Z轴的Z轴的周期性不对称变化,其可以充当大规模平行和乘以堆叠的褐色棘轮。各向同性和各向异性蚀刻工艺的蚀刻速率强烈地取决于结构的尺寸和形状。研究了小尺寸结构的底切现象(小于2‰m)。在蚀刻以使硅表面平滑后暴露进入NH 3等离子体的血浆被讨论也是如此。

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