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Optically-detected charge density dynamics in organic lightemitting diodes (OLEDs)

机译:有机发光二极管(OLED)中的光学检测电荷密度动态

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Electro-modulation (EM) is used to measure interfacial hole densities in operating OLEDs. This in-situ optical probe has provided us with a measure of relative hole and electron currents in a wide range of OLED structures. Insight to the dynamics of interfacial hole densities allows an assessment of the longterm stability of electron-hole balance, and therefore helps greatly with the identification of electroluminescence (EL) degradation mechanisms. Here, we limit the investigation to NPB/AlQ_3 OLEDs, but note that the technique is versatile, and can be readily adapted to a wide range OLED structures, especially those comprising arylamine -based hole transport materials and interlayers.
机译:电调用(EM)用于测量操作OLED中的界面孔密度。该原位光学探针已经为我们提供了众多OLED结构中的相对孔和电子电流的量度。界面孔密度的动态的洞察允许评估电子空心平衡的长期稳定性,因此通过识别电致发光(EL)降解机制有助于大大帮助。在此,我们将研究限制对NPB / ALQ_3 OLED,但注意该技术是多功能的,并且可以容易地适应宽范围的OLED结构,尤其是包括芳基胺的空穴传输材料和夹层的宽范围的OLED结构。

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