Application of the dual energy technique by using a photon counting CdTe detector

摘要

We have proposed a new system for X-ray computed tomography (CT) scanning. By employing the dual-energy measurement, the obtained data can be used to deduce distribution images of the atomic number and electron density which are useful for identifying the scanned material. In this work, two different methods were given for the derivative process. We found method A was suitable for measuring low-Z materials while method B worked well for high-Z materials. Therefore, the two derivative methods may work complementally for material identification.