High Spatial Resolution X-Ray Mapping of CdZnTe detectors

摘要

CdZnTe (CZT) is the most promising semiconductor for room-temperature nuclear radiation detectors. At Brookhaven's National Synchrotron Light Source (NSLS), we used a highly collimated synchrotron X-ray radiation to map different CZT detectors. In this paper, the latest results from high spatial resolution X-ray mapping of CZT detectors are reported. Effects of different internal defects on the performance of CZT detectors are discussed.