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Study of slider-defect Interaction at ultralow flying height by dynamic flying height control

机译:动态飞行高度控制超级飞行高度滑块缺陷相互作用研究

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In this study, the interaction of the magnetic head slider and magnetic disk defects were studied as the function of the head flying height controlled by the dynamic flying height (DFH) control method. In the conventional glide test, the flying height is set as a function of the rotational velocity. However, in the glide test using the DFH control method, the flying height could be set as a function of DFH power on a constant rotational velocity. A magnetic disk with two types of defects-a crater and a 5 nm bump-was prepared. The acoustic emission (AE) signal at the slider-defect contacts from the conventional glide test and the DFH glide test were then compared. The results of the experiment indicated that the DFH glide test could detect these defects at a few nanometers flying height, but the conventional glide test could not detect them. This was because the AE signal burst below a flying height of 3 nm. The AE signal output of the DFH glide test was higher than that of the conventional glide test, and the AE signal of the defect contact increased at a greater rotational velocity. It was concluded that the DFH control glide testing was one of the most important techniques for the future high-density recording disks.
机译:在该研究中,研究了磁头滑块和磁盘缺陷的相互作用作为由动态飞行高度(DFH)控制方法控制的头部飞行高度的功能。在传统的滑翔试验中,将飞行高度设定为旋转速度。然而,在使用DFH控制方法的滑翔试验中,可以将飞行高度设置为DFH电源的恒定旋转速度。制备具有两种类型缺陷的磁盘 - 制备了火山口和5nm凸块 - 是制备的。然后比较来自常规滑动试验和DFH滑动试验的滑块缺陷触点的声发射(AE)信号。实验结果表明,DFH滑翔试验可以在几纳米飞行高度检测这些缺陷,但传统的滑翔试验无法检测到它们。这是因为AE信号突发到3nm的飞行高度以下。 DFH滑翔试验的AE信号输出高于传统滑动测试的AE信号输出,并且缺陷触头的AE信号以更大的旋转速度增加。得出的结论是,DFH控制滑翔测试是未来高密度记录磁盘最重要的技术之一。

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