Gamma Profile Analysis for Stress, Texture and Grain Size

摘要

Two-dimensional X-ray diffraction pattern can be described by the diffraction intensity distribution in both 20 and y directions. The 2D pattern can be reduced to two kinds of profiles: 29-profile and y-profile. The 29-profile can be evaluated for phase identification, crystal structure refinement and many applications with many existing algorithms and software. The y-profile contains information on texture, stress, and crystal grain size. This article introduces the concept and fundamental algorithms for stress, texture and crystal size analysis by y-profile analysis.