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Totally self-checking FSM design based on multilevel synthesis methods and FPGA implementation

机译:基于多级合成方法和FPGA实现的全面自检FSM设计

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Achieving acceptable reliability level for VLSI is one of the most critical issues that need to be faced. On-line testing techniques development is applicable solution of the problem. For this aim it is necessary to engineer cost effective self-checking VLSI circuits with using the proper CAD tools. It is profitable to elaborate such tools using suitable non self-checking design tools that have been just developed In this paper we research FSM self-checking design abilities for ROBDD or free BDD with using LUT based FPGA technology. It is established that direct covering ROBDD (free BDD) with CLBs provides a unidirectional manifestation of faults resulted from FPGA technology. We also suggest a self-checking (m,n) code checker implementation oriented to FPGA technology.
机译:实现VLSI可接受的可靠性水平是需要面临的最关键的问题之一。在线测试技术的开发适用于问题的解决方案。为此目的,有必要使用适当的CAD工具工程师进行高效的自检VLSI电路。利用本文刚刚开发的合适的非自检设计工具详细说明了这些工具,我们将研究FSM自检设计能力,用于使用基于LUT基于LUT的FPGA技术的ROBDD或免费BDD。建立了具有CLB的直接覆盖ROBDD(免费BDD)提供了由FPGA技术产生的故障的单向表现。我们还建议以FPGA技术为导向的自检(M,N)代码检查器实现。

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